Surface Analysis of the Interface Between E-beam Evaporated Boron and Si(111)
Authors
Term
4. term (FYS10)
Education
Publication year
2024
Submitted on
2024-05-31
Pages
67
Abstract
This project aims to investigate the interface of boron evaporated on the Si(111) surface, by means of XPS at the ASTRID2 synchrotron facility at the University of Aarhus. Before conducting XPS experiments we will investigate how to control the e-beam evaporator utilized in this project. This will be done at a LEED/Auger experimental setup at Aalborg University. Relevant theory for LEED, AES, XPS, synchrotrons and semiconductors will be covered and the various experimental setups utilized in the project will be detailed. For the XPS experiments we will investigate the surface states appearing in the valence band and the Si2p spectra. The dependence of the B1s transition on the boron thickness will be discussed and influence of carbon and oxygen contamination will be examined. Furthermore we will go over the positioning of the Fermi level and use this to determine the amount of doping in the Si(111) sample.
Keywords
Surface Science ; Boron ; E-beam evaporation ; Silicon ; Si(111) ; Fermi Level ; Surface States ; XPS ; AES ; LEED ; Synchrotron ; ASTRID2
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