With the development of electronic devices, the high technology industry has an increasing need to deal with the problems of EMC. It is well known that finalised products can fail the EMC requirements therefore bringing them back to the designing process. These failures are very costly. Thus it is very important to be able to design a product that will pass the EMC regulations at the first design.\\
In order to address this problem, we have created a program that calculates the far-fields that radiate from a source using the measured near-fields of this source. We have validated this program and then compared the results to some measurements.\\
The comparison between the calculated far-fields and the measured ones has proven to be imperfect. Therefore some hypothesis have been made to improve the matching between the calculations and the measurements.